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Scanning Electron Microscopy

JEOL JSM 6320F Field Emission SEM provides high-resolution (~1 nm) secondary and backscattered electron images of many types of samples. This SEM has a low-temperature sample chamber attached to the microscope column that enables wet and bio-samples to be characterized. Low voltage imaging and microanalysis can be used to analyze insulating or electron beam sensitive materials. High energy-resolution and high-sensitivity energy dispersive X-ray spectroscopy (EDS) can provide qualitative and quantitative elemental analyses of biological and non-biological materials. All images are acquired, analyzed and shared digitally.

Amray 1600 SEM provides a resolution of ~4-5 nm for SEM imaging with high throughput stages and sample holders. Energy dispersive X-ray spectroscopy (EDS) and wavelength dispersive X-ray spectroscopy (WDS) can provide qualitative and quantitative elemental analyses. All images can be acquired and shared digitally.