• CNS Home
• ABOUT
  • About Us
  • CNS Mission Statement
  • CNS Facts
• Members
• Research
• Microscopy
  • Microscopy Image and Spectroscopy Technology Laboratory
  • Scanning Electron Microscopy
  • Transmission Electron Microscopy
  • Scanning Probe Microscopy
• X-Ray
  • X-Ray Diffraction Laboratory
  • Single Crystal X-Ray Diffraction Instrumentation
  • Powder Diffraction Instrumentation
  • Computer Facilities and Other Instrumentation
• Analytical Facilities
  • Molecular Modeling and Simulation
  • Facilities Molecular Modeling
  • High Field NMR Facility
  • Mass Spectrometry Facility
• Events
  • Events
  • Seminars
• CNS News
• Departmental Links
• CONTACT US

 

 

Microscopy Image and Spectroscopy Technology Laboratory

Micro- and nano-structural characterization is key to development and application of nanotechnology in fields ranging from medicine to crime scene investigation, from materials engineering to catalysis, and from the electronic device industry to the study of extraterrestrial materials and plants. The microscopy image and spectroscopy technology (MIST) laboratory at the Center for Nanoscience has expertise and equipment for various types of specimen preparation and microscopic analysis. The laboratory supports research and training programs, and provides analytical support and referrals for local industries and members of the academic community. Facility scientists provide comprehensive consultation on micro- and nano-characterization (SEM, EDS, TEM, HRTEM, AFM, and STM).

For more information please contact Dr. Dan Zhou at (314) 516-4627 or (314) 516-5024 or zhouda@umsl.edu.

Recently Purchased Instrumentation

Rigaku Ultimate IV X-ray Diffraction and Small Angle X-ray
Fully integrated within the automated diffraction system and is compaitble with the full range of X-ray sources and the Ultimate IV goniometer configurations (Focusing and Parallel Beam Geometries with Cross Beam Optics). The CBO technology, automatic alignment, and a flexible modular design combine to provide simple, fast reconfiguation of diverse applications, including (i) powder diffraction: phase identification, quantitative analysis, percent crystallinity, crystallite size/strain analysis, precise lattice parameter determination, and rietveld refinement; (ii) stress and texture: stress determination, conventional pole figures and in-plane, inverse, as well as transmission pole figures; (iii) small angle X-ray scattering: macromolecular structure and orientation in polymetric materials, particle size distribution of nanoparticles suspended in solution, particle/pole size distributions in deposited or bulk solid nanomaterials, and molecular morphology and orientation in nanocomposites; (iv) thin film analysis: phase identification, orientation/texture, crystal perfection, and thickness and density, as well as interface roughness; (v) high temperature attachment: an automated variable temperature stage for in situ X-ray diffraction measurements of materials at elevated temperatures.

Carl Zeiss 700 Laser Scanning Microscope
Equipped with 4 laser lines including a near UV 405 nm laser, inverted microscope with 20x, 40x, and 60x oil or water immersion lens, two simultaneous channels of detection, and a completed software package for image analysis and constructions. The LSM 700 offers innovative solutions for image analyses of extraordinary sensitivity and quality. The LSM 700 is distinguished by high flexibilty with regard to applications and system configuation. Applications range from simple routine examinations to multidimensional image acquisition in biomedical research.

TA Insrument Differential Scanning Calorimeter (DSC)
Measures temperatures and heat flows associated with thermal transitions in a material. Common applications include investigation, selection, comparison and end-use performance evaluation for materials in research, quality control, and production applications. Properties measured include glass transitions, "cold" crystallization, phase changes, melting, crystallization, product stability, cure/cure kinetics, and oxidative stability.

TA Instrument Thermogravimetric Analysis (TGA)
Provides weight changes in a material as a function of temperature (or time) under a controlled atmosphere. Uses include measurement of a material's thermal stability, decomposition kinetics, oxidative stability, and moisture/volatile content.

TA Instrument AR 2000 Rheometer
Measures visco-elastic properties of materials beyond just viscosity. This Rheometer provides material behavior such as yield stress, kinetic properties, complex viscosity, modulus, creep, and recovery. The Rheometer is versatile and useful for characterizing a materials viscosity and/or viscoelastic properties.

Spectra-Physics HPLC
Provides accurate proportioning of binary and ternary mobile phase compositions in either gradient or isocratic modes. The system has an auto-sampler and both UV-VIS and RI detectors.

Leica Fluorescence Optical Microscope
Provides bright field and dark field images, phase contrast and Polarized images, and interference contrast imaging. This optical microscope system is also equipped with a high resolution digital camera.

Sample Preparation Laboratory
Equipped with various electron microscopy sample preparation instruments, including two different ultramicrotomes, diamond saw and ultrasonic drill, dimpling machine, ion milling machine with two argon beams, Au/Pd sputtering coater, high vacuum-high temperature thermal evaporator for metallic thin coating, low temperature furnace, and stereo-microscopes.